Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials

by Otwin Breitenstein
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$161.46
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Otwin Breitenstein Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials
Otwin Breitenstein - Lock-in Thermography - Basics and Use for Evaluating Electronic Devices and Materials

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Description

This is the first book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices. This useful introduction and guide reviews various experimental approaches to lock-in thermography, with special emphasis on the lock-in IR thermography developed by the authors themselves.

Contributors

Author:
Otwin Breitenstein
Wilhelm Warta
Martin Langenkamp

Further information

Illustrations Note:
X, 258 p. 89 illus., 33 illus. in color.
Table of Contents:
Physical and Technical Basics.- Experimental Technique.- Theory.- Measurement Strategies.- Typical Applications.- Summary and Outlook.
Remarks:
Only book in the market on this highly sensitive infrared measurement method


Explains the basics and applications of this analytical technique


A reference work for researchers and engineers alike


Includes supplementary material: sn.pub/extras

Media Type:
Hardcover
Publisher:
Springer Berlin
Biography Artist:
Otwin Breitenstein studied physics at Leipzig university and graduated there in 1980. After dealing with spatially resolved capacitance spectroscopy of point defects (Scanning-DLTS) at the Institute of Solid State Physics and Electron Microscopy in Halle until 1992, he is a scientific staff member at Max Planck Institute of Microstructure Physics, Halle. His main interest field is electronic device and materials analysis by electron microscopic and IR-based methods.
Wilhelm Warta studied Physics at W├╝rzburg and then Stuttgart University, where he graduated and received his PhD with research on charge transport properties of organic molecular crystals. 1985 he joined Fraunhofer Institute for Solar Energy Systems in Freiburg starting with work on carrier lifetime measurement techniques for semiconductor materials. His fields are the development of measurement techniques for solar cell development, characterization of solar cell material and solar cells, device and process simulation as well as high precision calibration of solar cells.
Language:
English
Edition:
2nd ed. 2010
Number of Pages:
258
Summary:
Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.

Master Data

Product Type:
Hardback book
Package Dimensions:
0.234 x 0.155 x 0.023 m; 0.522 kg
GTIN:
09783642024160
DUIN:
FN6OO3B475G
$161.46
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